University of Taipei:Item 987654321/2575
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 3313/17059 (19%)
Visitors : 1037817      Online Users : 505
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version


    Please use this identifier to cite or link to this item: http://utaipeir.lib.utaipei.edu.tw/dspace/handle/987654321/2575


    Title: Effect of annealing of Ag ultrathin films on Co/Pt(111) surface
    Authors: Shern, C. S.
    Tsay, J. S.
    Chen, S. L.
    Wu, Y. E.
    吳月娥
    蔡志申
    Contributors: Journal of Applied Physics
    Date: 1999
    Issue Date: 2009-07-27 14:34:35 (UTC+8)
    Abstract: Low-energy electron diffraction was used to study the annealing effects of Ag ultrathin films on the surface of one monolayer Co/Pt(111). The intensity of the specular beam versus temperature has an unusual minimum point and maximum point. Further studies by Auger electron spectroscopy indicate that the adatoms of Ag become a best ordered state after the formation of Co-Pt alloy is complete. The new order state comes from the structure change of Co/Pt(111) and the smaller lattice mismatch between Ag and Pt. The electron density of states of d band shifts to a lower binding energy when the system starts to form the Co-Pt alloy measured by ultraviolet photoelectron spectroscopy. The chemical compositions at interfaces of the thin film were investigated by a depth profile before and after the annealing. The sputtering rates of Ag on the topmost layer of the unannealed film and the annealed film were calculated and comparatively studied. A shadow effect causes the different sputtering rates of these two ultrathin films.
    Keywords: silver, cobalt, platinum, annealing, metallic thin films, low energy electron diffraction, Auger effect, interface
    Relation: Journal of Applied Physics, V85(1), p. 228-232
    Appears in Collections:[Department of Applied Physics and Chemistry] Periodical Articles

    Files in This Item:

    There are no files associated with this item.



    All items in uTaipei are protected by copyright, with all rights reserved.


    如有問題歡迎與系統管理員聯繫
    02-23113040轉2132
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback